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Proceedings Paper

Imaging pyrometry of oxides
Author(s): Michael E. Thomas; Patrick S. Wayland; David H. Terry
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Paper Abstract

A technique for imaging pyrometry of oxides will be presented which is capable of remotely determining the temperatures of an oxide surface with useful accuracy. The technique relies on the near-blackbody emittance properties of most oxides in the two-phonon spectral region. Most oxides in the longwave IR region are very highly emitting with an emittance that is almost temperature independent and Lambertian. We present a generalized calibration procedure for longwave cameras that allows spatially resolved surface temperature to be obtained from radiance measurements. Experimental results from a sapphire disk will be presented as a demonstration of the technique.

Paper Details

Date Published: 26 March 1998
PDF: 12 pages
Proc. SPIE 3361, Thermosense XX, (26 March 1998); doi: 10.1117/12.304720
Show Author Affiliations
Michael E. Thomas, Johns Hopkins Univ. (United States)
Patrick S. Wayland, Johns Hopkins Univ. (United States)
David H. Terry, Johns Hopkins Univ. (United States)


Published in SPIE Proceedings Vol. 3361:
Thermosense XX
John R. Snell; Richard Norman Wurzbach, Editor(s)

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