Share Email Print
cover

Proceedings Paper

Modeling and estimation of FPN components in CMOS image sensors
Author(s): Abbas El Gamal; Boyd A. Fowler; Hao Min; Xinqiao Liu
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Fixed pattern noise (FPN) for a CCD sensor is modeled as a sample of a spatial white noise process. This model is, however, not adequate for characterizing FPN in CMOS sensors, since the redout circuitry of CMOS sensors and CCDs are very different. The paper presents a model for CMOS FPN as the sum of two components: a column and a pixel component. Each component is modeled by a first order isotropic autoregressive random process, and each component. Each component is modeled by a first order isotropic autoregressive random process, and each component is assumed to be uncorrelated with the other. The parameters of the processes characterize each component of the FPN and the correlations between neighboring pixels and neighboring columns for a batch of sensor. We show how to estimate the model parameters from a set of measurements, and report estimates for 64 X 64 passive pixel sensor (PPS) and active pixel sensor (APS) test structures implemented in a 0.35 micron CMOS process. High spatial correlations between pixel components were measured for the PPS structures, and between the column components in both PPS and APS. The APS pixel components were uncorrelated.

Paper Details

Date Published: 1 April 1998
PDF: 10 pages
Proc. SPIE 3301, Solid State Sensor Arrays: Development and Applications II, (1 April 1998); doi: 10.1117/12.304560
Show Author Affiliations
Abbas El Gamal, Stanford Univ. (United States)
Boyd A. Fowler, Stanford Univ. (United States)
Hao Min, Fudan Univ. (China) (United States)
Xinqiao Liu, Stanford Univ. (United States)


Published in SPIE Proceedings Vol. 3301:
Solid State Sensor Arrays: Development and Applications II
Morley M. Blouke, Editor(s)

© SPIE. Terms of Use
Back to Top