Share Email Print
cover

Proceedings Paper

Improving resolution of solid state linear array x-ray detectors
Author(s): Guillem Borras; Christophe Odet; Kimmo Vuorinen; Frederic Gaffiot; Gilles Jacquemod
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Linear solid-state detectors are nowadays a widespread media in industrial and medical x-ray imaging. The resolution reached with this system has been largely improved in these past years, but is still too poor for some high resolution applications. We first have carried out an optimization of the detector characteristics through a behavioral simulation using a hardware description language. Furthermore, our work concerned the resolution enhancement for this kind of detectors via signal processing. Our approach takes into account the modeled point spread function (PSF) of the system. This modeled PSF is obtained with a new edge technique. The knowledge about the system response is used in a restoration scheme in order to improve the response of the detector to the high frequencies in the digital image. The restoration problem is an ill posed problem ad uses an inverse Wiener filtering. Another intrinsic limitation of solid-state detectors is the spatial sampling step. In order to overcome this problem, we also tested the feasibility of a finer sampling of the acquired image, buy interlacing several slightly shifted acquisitions of the same test object. The restoration applied to this finer sampled signal results in a resolution enhancement that is theoretically impossible to reach with a single detector acquisition. Some experimental results obtained on a variable bar-space pattern phantom are presented. This kind of phantom allows for a precise evaluation of the modulation transfer function on the acquired and processed images. The contribution of the image processing to the restoration enhancement can thus be quantified.

Paper Details

Date Published: 1 April 1998
PDF: 10 pages
Proc. SPIE 3301, Solid State Sensor Arrays: Development and Applications II, (1 April 1998); doi: 10.1117/12.304553
Show Author Affiliations
Guillem Borras, INSA de Lyon (France)
Christophe Odet, INSA de Lyon (France)
Kimmo Vuorinen, LEAME/Ecole Centrale de Lyon (France)
Frederic Gaffiot, LEAME/Ecole Centrale de Lyon (France)
Gilles Jacquemod, LEAME/Ecole Centrale de Lyon (France)


Published in SPIE Proceedings Vol. 3301:
Solid State Sensor Arrays: Development and Applications II
Morley M. Blouke, Editor(s)

© SPIE. Terms of Use
Back to Top