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Proceedings Paper

Absolute calibration of charge-coupled devices to hard 8- to 98-keV x rays
Author(s): James Dunn; Alan D. Conder; Richard E. Stewart
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Paper Abstract

We describe experimental techniques for characterizing the absolute response of charge-coupled devices (CCD) to incident hard x-rays using the high energy x-ray source at the Lawrence Livermore National Laboratory. We present responsivity and quantum detection efficiency measurements for a standard, front-illuminated, scientific CCD to monoenergetic 8-98 keV K-(alpha) x-rays. This systematic study out to high energies reveals the contribution of different absorption processes to the CCD detection efficiency. For lower energies below 20 keV the CCD behaves like an ideal photoelectric detector as expected. Increasingly above 40 keV the photoelectric effect in the CCD epitaxial region is augmented by incoherent or Compton scattering where a fraction of the energy from the photon scattering event is transferred to the electrons and subsequently detected. The Compton scattering mechanism dominates the photoelectric effect above 100 keV giving the CCD a predicted detection efficiency which remains constant from 150 keV to 1 MeV assuming that the scattered electrons finally come to rest within the active region. These physics issues will be briefly discussed and are particularly relevant to deep active region solid-state detectors with application for hard x-ray detection above 40 keV.

Paper Details

Date Published: 1 April 1998
PDF: 8 pages
Proc. SPIE 3301, Solid State Sensor Arrays: Development and Applications II, (1 April 1998); doi: 10.1117/12.304551
Show Author Affiliations
James Dunn, Lawrence Livermore National Lab. (United States)
Alan D. Conder, Lawrence Livermore National Lab. (United States)
Richard E. Stewart, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 3301:
Solid State Sensor Arrays: Development and Applications II
Morley M. Blouke, Editor(s)

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