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Proceedings Paper

Large format CID x-ray image sensors
Author(s): Joseph Carbone; Zulfiquar Alam; Claudia Borman; Steven Czebiniak; H. Ziegler
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Paper Abstract

A large format CID imager module capitalizes on CID large well capacity and radiation resistance to image dental x- rays. The model, which consists of the imager, conversion phosphor and ancillary electronics, is encapsulated in a 40 X 28 X 5 mm3 robust package that is lightproof, moisture-proof and meets FDA and RFI/EMI standards. Data exposure and readout is simple. The imager normally exists in an active reset mode until x-ray application automatically places the imager into a charge integration mode. Readout begins immediately upon completion of the x- ray exposure or manual application of an external trigger source. The imager returns to the reset mode once the data read out is complete. Pixels are arranged in an SVGA compatible 800H X 600V format. Each pixel is square and 38.5 microns/side. The imager is coated using a propriety phosphor deposition process that result in a limiting resolution of 9 LP/mm from an x-ray illumination source. Better than 2,000:1 dynamic range and shot-noise limited operation is achieved. Direct x-ray detection and attendant noise is minimized via the phosphor and epitaxial layer that lies beneath the pixel array. The imager/module architecture and electro-optical performance are described in detail here in.

Paper Details

Date Published: 1 April 1998
PDF: 10 pages
Proc. SPIE 3301, Solid State Sensor Arrays: Development and Applications II, (1 April 1998); doi: 10.1117/12.304550
Show Author Affiliations
Joseph Carbone, CID Technologies, Inc. (United States)
Zulfiquar Alam, CID Technologies, Inc. (United States)
Claudia Borman, CID Technologies, Inc. (United States)
Steven Czebiniak, CID Technologies, Inc. (United States)
H. Ziegler, CID Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 3301:
Solid State Sensor Arrays: Development and Applications II
Morley M. Blouke, Editor(s)

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