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Proceedings Paper

Large-area low-noise amorphous silicon imaging system
Author(s): Raj B. Apte; Robert A. Street; Steve E. Ready; David A. Jared; Andrew M. Moore; Richard L. Weisfield; T. A. Rodericks; T. A. Granberg
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Paper Abstract

2D amorphous silicon arrays can be sued for medical imaging, non-destructive testing, and high-speed document scanning. We have built a 200 spi imaging system with an active area containing 2304 X 3200 pixels, the largest amorphous silicon imaging system described to data. Packaged with the array are peripheral electronics which include active matrix drivers, charge sensitive amplifiers, two 12 bit A/D converters, and control logic. Digital data travel via fiber to a frame grabber in a personal computer. Software includes gain/offset corrections, line and pixel corrections, window and level controls, and a user interface. Through a combination of layout optimization, amplifier design, and system timing, we have demonstrated a noise level of 1.5 Ke RMS and a signal to noise ratio of 1900.

Paper Details

Date Published: 1 April 1998
PDF: 7 pages
Proc. SPIE 3301, Solid State Sensor Arrays: Development and Applications II, (1 April 1998); doi: 10.1117/12.304549
Show Author Affiliations
Raj B. Apte, Xerox Palo Alto Research Ctr. (United States)
Robert A. Street, Xerox Palo Alto Research Ctr. (United States)
Steve E. Ready, Xerox Palo Alto Research Ctr. (United States)
David A. Jared, Xerox Palo Alto Research Ctr. (United States)
Andrew M. Moore, Xerox Palo Alto Research Ctr. (United States)
Richard L. Weisfield, dpiX, A Xerox New Enterprise Co. (United States)
T. A. Rodericks, dpiX, A Xerox New Enterprise Co. (United States)
T. A. Granberg, dpiX, A Xerox New Enterprise Co. (United States)


Published in SPIE Proceedings Vol. 3301:
Solid State Sensor Arrays: Development and Applications II
Morley M. Blouke, Editor(s)

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