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Proceedings Paper

Noise of high-Tc superconducting bolometers
Author(s): Igor A. Khrebtov; Vladimir Nikolaevic Leonov; A. D. Tkachenko; Pavel V. Bratukhin; Andrey A. Ivanov; Alexander V. Kuznetsov; Helmut Neff; Erwin Steinbeiss
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Paper Abstract

The results of experimental and theoretical investigations of the noise properties of high-Tc superconducting films and bolometers are reported. YBaCuO and GdBaCuO films produced by magnetron and laser deposition on various substrates were studied. The effect of various noise components on the noise equivalent power (NEP) of different bolometers is considered. Structural, noise and critical current properties were investigated. Using the laser ablation YBaCuO films with very low noise Hooge's parameter close to 2 X 10-4 was obtained. Experimental data are discussed on basis of the modern excess low frequency l/f models. Besides, the noise measurements of antenna YBaCuO microbolometers on NdGaO3 substrate and GdBaCuO bolometers on Si-membrane are reported. The NEP equals 1.2 X 10-11 W/Hz1/2 at response time of 0.3 microsecond(s) for microbolometer and D* equals 3.8 X 109 cmHz1/2W-1 at response time of 0.45 ms for bolometer on Si-membrane were reached. NEP of the bolometers is limited by only the phonon noise.

Paper Details

Date Published: 8 April 1998
PDF: 12 pages
Proc. SPIE 3287, Photodetectors: Materials and Devices III, (8 April 1998); doi: 10.1117/12.304492
Show Author Affiliations
Igor A. Khrebtov, S.I. Vavilov State Optical Institute (Russia)
Vladimir Nikolaevic Leonov, S.I. Vavilov State Optical Institute (Belgium)
A. D. Tkachenko, S.I. Vavilov State Optical Institute (Russia)
Pavel V. Bratukhin, Moscow Institute of Engineering and Physics (Russia)
Andrey A. Ivanov, Moscow Institute of Engineering and Physics (Russia)
Alexander V. Kuznetsov, Moscow Institute of Engineering and Physics (Russia)
Helmut Neff, Univ. of Parabio/Campina Grande (Denmark)
Erwin Steinbeiss, Institut fuer Physikalische Hochtechnologie (Germany)


Published in SPIE Proceedings Vol. 3287:
Photodetectors: Materials and Devices III
Gail J. Brown, Editor(s)

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