Share Email Print
cover

Proceedings Paper

Statistical process control by employing circular and spherical statistics for the interpretation of BRDF measurements
Author(s): Hendrik Rothe; Dorothee Hueser; Andre Kasper
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

It is pointed out that the von-Mises distribution can replace the Gaussian distribution for circular or spherical vector fields, i.e. BRDF data obtained from a variety of technical surfaces by stray light measuring or sensing. For the purpose of in line quality control formulae for the parameters corresponding to mean and variance in Gaussian distributions as well as parameter tests and confidence intervals for circular unimodal vector fields will be given. A family of scatter sensors is introduced. Finally, measurement results will be compared to circular statistical inference.

Paper Details

Date Published: 1 April 1998
PDF: 10 pages
Proc. SPIE 3275, Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II, (1 April 1998); doi: 10.1117/12.304389
Show Author Affiliations
Hendrik Rothe, Univ. of the Federal Armed Forces (Germany)
Dorothee Hueser, Univ. of the Federal Armed Forces (Germany)
Andre Kasper, Univ. of the Federal Armed Forces (Germany)


Published in SPIE Proceedings Vol. 3275:
Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II
John C. Stover, Editor(s)

© SPIE. Terms of Use
Back to Top