Share Email Print
cover

Proceedings Paper

Inspection tools for aerospace critical surfaces
Author(s): Gary L. Workman; G. Wayne Thompson; Billy H. Nerren; H. Dewitt Burns
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The measurement and control of cleanliness for critical surfaces during manufacturing and in service operations provides unique challenges in aerospace. For re-usable propulsion systems, such as the solid rocket motors, the current thrust for environmentally benign processes has had a major impact on programs designed for maintaining quality in the production of bondline surfaces. The major goal is to improve upon our ability to detect and identify possible contaminants which are detrimental to the integrity of the bondline. This effort requires an in-depth study of the possible sources of contamination, methodologies to detect and identify contaminants, discriminate between contaminants and chemical species caused by environmental conditions, and the effect of particular contaminants on the bondline integrity of the critical surfaces. This presentation will provide an overview of several optical methods used to detect and identify contamination on critical surfaces, currently being performed by the Surface Contamination and Analysis Team at Marshall Space Flight Center. The methods under development for contamination monitoring include FTIR and Near-IR SPectrometry, UV Fluorescence, and Variable Angle Spectroscopic Ellipsometry. Comparisons between these methods and the current primary tool, optical stimulation of electron emission for on-line inspection will be presented. Experiments include quantitative measurement of silicone and Conoco HD2 greases, metal hydroxides, tape residues, etc. on solid rocket motor surfaces.

Paper Details

Date Published: 15 March 1998
PDF: 11 pages
Proc. SPIE 3399, Process Control and Sensors for Manufacturing, (15 March 1998); doi: 10.1117/12.302562
Show Author Affiliations
Gary L. Workman, Univ. of Alabama in Huntsville (United States)
G. Wayne Thompson, Univ. of Alabama in Huntsville (United States)
Billy H. Nerren, NASA Marshall Space Flight Ctr. (United States)
H. Dewitt Burns, NASA Marshall Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 3399:
Process Control and Sensors for Manufacturing
Richard H. Bossi; David M. Pepper, Editor(s)

© SPIE. Terms of Use
Back to Top