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Proceedings Paper

Influence of dielectric layer (MgF2) on optical properties of Mn film
Author(s): Piotr Bieganski; E. Dobierzewska-Mozrzymas; E. Pieciul; Jacek Wojcik
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Paper Abstract

On the basis of the previous structural and electrical examinations it has been found that thin, especially discontinuous Mn films even under vacuum conditions are quickly oxidized. In order to protect from this process just after evaporation of Mn films, its were in vacuo covered with MgF2 layers. The influence of MgF2 dielectric layers with thickness dd approximately equals 21 nm on the optical properties of Mn films was investigated. The thicknesses of Mn films varied from 4 to 32 nm. Optical properties of double films (Mn + MgF2) differ distinctly from those of single Mn-films. Dielectric layers with thickness dd approximately equals 21 nm protect from oxidation process and cause an increase of reflection coefficients and decrease of transmission coefficients in the visible and infrared range.

Paper Details

Date Published: 1 January 1998
PDF: 3 pages
Proc. SPIE 3320, Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics, (1 January 1998); doi: 10.1117/12.301348
Show Author Affiliations
Piotr Bieganski, Technical Univ. of Wroclaw (Poland)
E. Dobierzewska-Mozrzymas, Technical Univ. of Wroclaw (Poland)
E. Pieciul, Technical Univ. of Wroclaw (Poland)
Jacek Wojcik, Technical Univ. of Wroclaw (Canada)


Published in SPIE Proceedings Vol. 3320:
Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics
Jerzy Nowak; Marek Zajac, Editor(s)

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