Share Email Print
cover

Proceedings Paper

Fringe pattern field analysis in planar waveguides investigation
Author(s): Roman Rogozinski; Aleksander Opilski
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In the paper an analysis of a fringe pattern field with an observation of a chosen fringe course, for defining the profile of refractive index of planar waveguides are proposed. With an application of the measuring method described, refractive profiles of planar waveguides, produced in the soda-lime glass by means of an ion exchange Ag+ $ARLR Na+ were examined.

Paper Details

Date Published: 1 January 1998
PDF: 6 pages
Proc. SPIE 3320, Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics, (1 January 1998); doi: 10.1117/12.301331
Show Author Affiliations
Roman Rogozinski, Silesian Technical Univ. (Poland)
Aleksander Opilski, Silesian Technical Univ. (Poland)


Published in SPIE Proceedings Vol. 3320:
Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics
Jerzy Nowak; Marek Zajac, Editor(s)

© SPIE. Terms of Use
Back to Top