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Proceedings Paper

Optoelectronic morphological processor for industrial online inspection
Author(s): Haisong Liu; Minxian Wu; Guofan Jin; Gang Cheng; Qingsheng He
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Paper Abstract

An optoelectronic morphological processor for industrial on- line inspection is presented in this paper. The principle of the processor is based on the morphological hit-miss transform. By using an extensive complementary encoding method, which combines the foreground and background of an image into a whole, the hit-miss transform, which usually needs three steps to perform, can be implemented in only one step. The optical implementation hardware is based on an incoherent optical correlator due to its compactness in structure and immunity to coherent noise. The experimental results are given.

Paper Details

Date Published: 2 February 1998
PDF: 8 pages
Proc. SPIE 3306, Machine Vision Applications in Industrial Inspection VI, (2 February 1998); doi: 10.1117/12.301237
Show Author Affiliations
Haisong Liu, Tsinghua Univ. (United States)
Minxian Wu, Tsinghua Univ. (China)
Guofan Jin, Tsinghua Univ. (China)
Gang Cheng, Tsinghua Univ. (United States)
Qingsheng He, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 3306:
Machine Vision Applications in Industrial Inspection VI
A. Ravishankar Rao; Ning S. Chang, Editor(s)

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