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Proceedings Paper

Automated detection of Karnal bunt teliospores
Author(s): Kim Dalton Linder; Chris W. Baumgart; Jim Creager; Bob Heinen; Tim Troupe; Dick Meyer; Janie Carr; Jack Quint
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Paper Abstract

Karnal bunt is a fungal disease which infects wheat and, when present in wheat crops, yields it unsatisfactory for human consumption. Due to the fact that Karnal bunt (KB) is difficult to detect in the field, samples are taken to laboratories where technicians use microscopes and methodically search for KB teliospores. AlliedSignal Federal Manufacturing & Technologies, working with the Kansas Department of Agriculture, created a system which utilizes pattern recognition, feature extraction, and neural networks to prototype an automated detection system for identifying KB teliospores. System hardware consists of a biological compound microscope, motorized stage, CCD camera, frame grabber, and a PC. Integration of the system hardware with custom software comprises the machine vision system. Fundamental processing steps involve capturing an image from the slide, while concurrently processing the previous image. Features extracted from the acquired imagery are then processed by a neural network classifier which has been trained to recognize `spore-like' objects. Images with `spore-like' objects are reviewed by trained technicians. Benefits of this system include: (1) reduction of the overall cycle-time; (2) utilization of technicians for intelligent decision making (vs. manual searching); (3) a regulatory standard which is quantifiable and repeatable; (4) guaranteed 100% coverage of the cover slip; and (5) significantly enhanced detection accuracy.

Paper Details

Date Published: 2 February 1998
PDF: 8 pages
Proc. SPIE 3306, Machine Vision Applications in Industrial Inspection VI, (2 February 1998); doi: 10.1117/12.301233
Show Author Affiliations
Kim Dalton Linder, AlliedSignal Inc. (United States)
Chris W. Baumgart, AlliedSignal Inc. (United States)
Jim Creager, AlliedSignal Inc. (United States)
Bob Heinen, AlliedSignal Inc. (United States)
Tim Troupe, AlliedSignal Inc. (United States)
Dick Meyer, AlliedSignal Inc. (United States)
Janie Carr, AlliedSignal Inc. (United States)
Jack Quint, AlliedSignal Inc. (United States)


Published in SPIE Proceedings Vol. 3306:
Machine Vision Applications in Industrial Inspection VI
A. Ravishankar Rao; Ning S. Chang, Editor(s)

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