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Proceedings Paper

Practical approach to evaluating mask CD uniformity patterned by a variable-shaped beam
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Paper Abstract

CD uniformity to be patterned by electron-beam (EB) writing system with a variable-shaped beam was evaluated. The experimental EB writing system, EX-8D, was used under conditions of current density of 20 A/cm2 and acceleration voltage of 50 keV. Quartz reticles coated with positive tone resist ZEP7000TM (Nippon Zeon Co., Ltd.) were applied. Test patterns of 1-micrometer-width design were written by shaped beam shots of 1 micrometer square with different exposure doses. Since higher measurement repeatability was confirmed, line width of test patterns without shot stitching points was measured by Nikon XY-3I with a circle-spot probe of 1 micrometer. Line width of clear patterns on resist film was measured after development, and line width of clear patterns on chrome (Cr) film of one mask was measured at same points after wet-etching. The other mask was measured at the same points after dry-etching process by conventional reactive ion etching (RIE). Certain comparisons in this study indicate the importance of evaluating CD uniformity on Cr film after dry- etching process. Expect for resist heating contribution by four-pass writing method, the uncertainty of CD error was quantified as follows: 4 nm (3(sigma) ) on resist film at the applied dose of 19 (mu) C/cm2, and 4 nm (3(sigma) ) on Cr film at the applied dose of 27 (mu) C/cm2.

Paper Details

Date Published: 12 February 1997
PDF: 8 pages
Proc. SPIE 3236, 17th Annual BACUS Symposium on Photomask Technology and Management, (12 February 1997); doi: 10.1117/12.301200
Show Author Affiliations
Shusuke Yoshitake, Toshiba Corp. (Japan)
Yoji Ogawa, Toshiba Corp. (Japan)
Hideaki Sakurai, Toshiba Corp. (Japan)
Masamitsu Itoh, Toshiba Corp. (Japan)
Iwao Higashikawa, Toshiba Corp. (Japan)
Noriaki Nakayamada, Toshiba Machine Co., Ltd. (Japan)
Kazuto Matsuki, Toshiba Machine Co., Ltd. (Japan)
Shuichi Tamamushi, Toshiba Machine Co., Ltd. (Japan)


Published in SPIE Proceedings Vol. 3236:
17th Annual BACUS Symposium on Photomask Technology and Management
James A. Reynolds; Brian J. Grenon, Editor(s)

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