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Proceedings Paper

Miniaturized optical microprobe for sizing in multiple-scattering systems
Author(s): Karsten Dierks; Matthias Dieckmann; J. Krueger
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Paper Abstract

Instruments based on photon counting in the visible part of the spectrum with subsequent signal autocorrelation of the light intensity fluctuation are widely used for the characterization of clear media, but are performance limited if multiple scattering samples or particle suspensions with an inherent diffusion limitation are probed. These systems are classified as turbid media. We give advanced approaches as to how multiple scattering systems predominantly existing in industry can be examined, in order to resolve the sizes of suspended scattering centers. Latex particles and emulsions were used as models. Monte Carlo calculations of the light transport mechanisms in turbid media were performed and compared with measurements. A dynamic light scattering instrument was used to perform measurements on highly concentrated and turbid samples. For example, with particle standards of 83 nm, a size of 85 nm +/- 5.8 nm (n equals 10) was obtained and particles with a size of 895 nm were measured to be 895 nm +/- 9.1 nm (n equals 10). The influence of multiple scattering on the autocorrelation function was both measured and calculated. We have shown that our calculations are in good agreement with the test results obtained and it was found that our miniaturized instrument is a valuable tool to measure particle sizes in turbid media.

Paper Details

Date Published: 1 January 1998
PDF: 8 pages
Proc. SPIE 3199, Biomedical Systems and Technologies II, (1 January 1998); doi: 10.1117/12.301114
Show Author Affiliations
Karsten Dierks, Dierks & Partner System Technology (Germany)
Matthias Dieckmann, European Space Agency/ESTEC (Netherlands)
J. Krueger, Dierks & Partner System Technology (Germany)


Published in SPIE Proceedings Vol. 3199:
Biomedical Systems and Technologies II
Francesco Baldini; Nathan I. Croitoru; Mark Russell Dickinson; Martin Frenz; Mitsunobu Miyagi; Riccardo Pratesi; Stefan Seeger, Editor(s)

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