Share Email Print

Proceedings Paper

Giant magnetoresistance effect in granular-type Co-Ag/Ag multilayers
Author(s): Rong Jun Zhang; Liang-Yao Chen; Shi-Ming Zhou; Yu Wang; Bo Xu; Dong-Liang Qian; Wei-Ming Zheng; Yu-Xiang Zheng
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

For the granular type of Co-Ag (1.8 nm)/Ag multilayers with the Co contents of 22, 45, and 65 at%, the magneto-resistance ratio ((Delta) R/R) has a maximum found with respect to the AG spacer layer thickness. It is found that with increasing Co content the (Delta) R/R peak shifts towards thicker AG layers. For the Co-Ag/Ag multilayers with low Co contents, (Delta) R/R increases monotonically with increasing magnetic layer thickness, but has a maximum near the magnetic layer thickness of 2.2 nm for the sample having a higher Co content. The peak is thought as a result of the antiferromagnetic (AFM) coupling between the nearest Co clusters in neighboring magnetic layers. In the high field region, the magnetization and the square root of (Delta) R/R vary as a linear function of the reciprocal applied field for all multilayers. In the low field range, they are proportional to the applied field for samples with thin magnetic layers.

Paper Details

Date Published: 20 February 1998
PDF: 5 pages
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, (20 February 1998); doi: 10.1117/12.300729
Show Author Affiliations
Rong Jun Zhang, Fudan Univ. (China)
Liang-Yao Chen, Fudan Univ. (China)
Shi-Ming Zhou, Fudan Univ. (China)
Yu Wang, Fudan Univ. (China)
Bo Xu, Fudan Univ. (China)
Dong-Liang Qian, Fudan Univ. (China)
Wei-Ming Zheng, Fudan Univ. (China)
Yu-Xiang Zheng, Fudan Univ. (China)

Published in SPIE Proceedings Vol. 3175:
Third International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)

© SPIE. Terms of Use
Back to Top