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Proceedings Paper

Relationship between resistivity and temperature for Hg1-xCdxTe photoconductive detectors
Author(s): Yongsheng Gui; Guozhen Zheng; X. C. Zhang; Shaoling Guo; Junhao Chu; Yi Cai
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Paper Abstract

Two kinds of two dimensional electrons in same surface have been found in Hg1-xCdxTe (x equals 0.214) photoconductive detectors from studies of the shubnikov-de Haas (SdH) oscillation. It has been found that the number of electrons in each kind is about constant from 1.5 K to 55 K by SdH measurements. A model considered two kinds of surface electrons is proposed to fit the temperature dependence of the resistivity. The electrical parameters obtained by this model agree well with the experiment and the results given by SdH measurements. This paper offers a simple and effective model to investigate the bulk and surface electrical properties for a two-terminal device.

Paper Details

Date Published: 20 February 1998
PDF: 4 pages
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, (20 February 1998); doi: 10.1117/12.300710
Show Author Affiliations
Yongsheng Gui, Shanghai Institute of Technical Physics (China)
Guozhen Zheng, Shanghai Institute of Technical Physics (China)
X. C. Zhang, Shanghai Institute of Technical Physics (China)
Shaoling Guo, Shanghai Institute of Technical Physics (China)
Junhao Chu, Shanghai Institute of Technical Physics (China)
Yi Cai, Kunming Institute of Physics (China)


Published in SPIE Proceedings Vol. 3175:
Third International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)

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