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Proceedings Paper

Microstructure and fractal growth mechanism of sputtered films of Bi2Sr2Ca1Cu2O7-x on Si substrates
Author(s): Wensheng Qian; Liu Rong; Tongli Wei
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Paper Abstract

Bi2Sr2Ca1Cu2O7-x(BSCCO) superconducting films were deposited on Si substrates with buffer layers of Y- stabilized ZrO2 films (YSZ) by magnetic sputtering. The critical temperature (Tc) of BSCCO film on YSZ/Si was 82 K. The microstructure of BSCCO/YSZ/Si was studied by scanning electronic microscope (SEM) and atom force microscope (AFM), the growing model of spiral nucleation was verified. Fractal images were found in the micrographs, and their growth mechanism was presented.

Paper Details

Date Published: 20 February 1998
PDF: 6 pages
Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, (20 February 1998); doi: 10.1117/12.300695
Show Author Affiliations
Wensheng Qian, Southeast Univ. (China)
Liu Rong, Southeast Univ. (China)
Tongli Wei, Southeast Univ. (China)

Published in SPIE Proceedings Vol. 3175:
Third International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang; Yi-Xin Chen; Shuzheng Mao, Editor(s)

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