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Proceedings Paper

Analytical radiative transfer modeling for coastal water quality remote sensing: inclusion of a fluorescence term
Author(s): Charles R. Bostater; Jan Rebmann
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Paper Abstract

An analytical solution of the two flow irradiance equations are presented and described for exploring applications regarding the spectral response signatures of water surface reflectance due to the conversion of direct collimated light to the diffuse irradiance field by elastic and inelastic scattering and absorption processes and effects. The conversion efficiency or rate of conversion of a collimated beam is modeled and results presented in terms of model sensitivity results to describe the (1) general effects of a collimated beam due to a source function undergoing inelastic scattering, (2) model results without the collimated component and the resulting model effects on predicted sensor derived water surface reflectance. The model results indicates the important role of bottom reflectance on the returned signal in relatively shallow water where scattering and dissolved constituents are in low concentrations. In deeper water or where the constituents are at higher concentrations, the fluorescence effect on reflectance will be small, depending on the conversion rate of the collimated light to the diffuse light and collimated source intensity. The model has potential applications to near nadir viewing geometry of a water column in estuarine and coastal waters or waters overlying coral reefs. The analytical solution to the two-flow equations developed by Bostater, et al. are thus shown to have transferability to problems in fluorescence research.

Paper Details

Date Published: 30 December 1997
PDF: 8 pages
Proc. SPIE 3222, Earth Surface Remote Sensing, (30 December 1997); doi: 10.1117/12.298172
Show Author Affiliations
Charles R. Bostater, Florida Institute of Technology (United States)
Jan Rebmann, Florida Institute of Technology (United States)


Published in SPIE Proceedings Vol. 3222:
Earth Surface Remote Sensing
Giovanna Cecchi; Edwin T. Engman; Eugenio Zilioli, Editor(s)

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