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Proceedings Paper

Absolute sapphire optical fiber sensor for high-temperature applications
Author(s): Hai Xiao; Wei Zhao; Robert Lockhart; Jun Wang; Anbo Wang
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Paper Abstract

This paper describes sapphire fiber-based EFPI sensors incorporated with wavelength scanning absolute signal demodulation. Silica-based optical fiber extrinsic Fabry- Perot interferometric (EFPI) sensors have been very successfully used in measuring a wide range of physical and chemical parameters. However, these fibers can only sustain temperatures of 800 degrees C because of germanium thermal diffusion affecting both the attenuation and waveguide multi-mode properties of the fiber. Since sapphire has a melting point above 2000 degrees C, sapphire optical fiber can be potentially used up to 2000 degrees C in an EFPI scheme. We obtain a resolution of 0.02 micrometers with a dynamic range of 27 micrometers for micro-displacement measurement.

Paper Details

Date Published: 2 January 1998
PDF: 7 pages
Proc. SPIE 3201, Sensors and Controls for Advanced Manufacturing, (2 January 1998); doi: 10.1117/12.298022
Show Author Affiliations
Hai Xiao, Virginia Polytechnic Institute and State Univ. (United States)
Wei Zhao, Virginia Polytechnic Institute and State Univ. (United States)
Robert Lockhart, Virginia Polytechnic Institute and State Univ. (United States)
Jun Wang, Virginia Polytechnic Institute and State Univ. (United States)
Anbo Wang, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 3201:
Sensors and Controls for Advanced Manufacturing
Bartholomew O. Nnaji; Anbo Wang, Editor(s)

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