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Proceedings Paper

Optical gating techniques for material inspection
Author(s): Mark Bashkansky; Michael D. Duncan; John F. Reintjes
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Paper Abstract

Optical gating techniques provide an important method for the non-destructive evaluation of a number of different transparent, translucent, and even highly scattering materials. We have used optical coherence tomography with 1.3 micrometers wavelength light to probe the subsurface region of ceramic, diamond film, single crystal silicon carbide, and other samples. We have demonstrated sample penetration depths of 100 to 1300 micrometers . We have achieved lateral spatial resolutions of 5 micrometers and depth resolutions of 10 micrometers . We have developed scanning techniques that allow planes in the sample to be imaged in less than 1 second and we have extended the scanning capabilities to allow for scanning over spherical convex or concave surfaces.

Paper Details

Date Published: 2 January 1998
PDF: 9 pages
Proc. SPIE 3201, Sensors and Controls for Advanced Manufacturing, (2 January 1998); doi: 10.1117/12.298019
Show Author Affiliations
Mark Bashkansky, Naval Research Lab. (United States)
Michael D. Duncan, Naval Research Lab. (United States)
John F. Reintjes, Naval Research Lab. (United States)

Published in SPIE Proceedings Vol. 3201:
Sensors and Controls for Advanced Manufacturing
Bartholomew O. Nnaji; Anbo Wang, Editor(s)

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