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Proceedings Paper

Simultaneous measurement of dispersion, spectrum, and distance with a Fourier transform spectrometer
Author(s): Thomas Hellmuth; M. Welle
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Paper Abstract

A Fourier transform spectrometer is used to simultaneously measure thickness, dispersion and absorption spectrum of a sample. It is shown that short coherence interferometry has the potential to measure the three dimensional distribution of the structure, the spectral absorption and dispersion of a sample.

Paper Details

Date Published: 29 December 1997
PDF: 8 pages
Proc. SPIE 3197, Optical Biopsies and Microscopic Techniques II, (29 December 1997); doi: 10.1117/12.297973
Show Author Affiliations
Thomas Hellmuth, Fachhochschule Aalen (Germany)
M. Welle, Fachhochschule Aalen (Germany)


Published in SPIE Proceedings Vol. 3197:
Optical Biopsies and Microscopic Techniques II
Irving J. Bigio; Herbert Schneckenburger; Jan Slavik; Katarina Svanberg M.D.; Pierre M. Viallet, Editor(s)

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