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Proceedings Paper

Multiple fluorescence microscopy and optoelectronic imaging: possibilities and limits
Author(s): Heinz Gundlach
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Paper Abstract

The last 20 years have seen an unexpected great renaissance and a partial revolution in light microscopy. This recent progress is due to new design in optics and instrumentation as well as improvement of optical contrast enhancement techniques. Recent progress in fluorescence microscopy is achieved by multiparameter fluorescence techniques, by improvement of conventional photomicrography as well as by optoelectronic imaging, confocal laser scanning microscopy, image processing and analysis. Due to the increase in number of fluorescence dyes, double and triple bandpass filter sets permit a rapid changeover between different fluorochromes simultaneously.

Paper Details

Date Published: 29 December 1997
PDF: 3 pages
Proc. SPIE 3197, Optical Biopsies and Microscopic Techniques II, (29 December 1997); doi: 10.1117/12.297968
Show Author Affiliations
Heinz Gundlach, Carl Zeiss (Germany)


Published in SPIE Proceedings Vol. 3197:
Optical Biopsies and Microscopic Techniques II
Irving J. Bigio; Herbert Schneckenburger; Jan Slavik; Katarina Svanberg; Pierre M. Viallet, Editor(s)

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