Share Email Print
cover

Proceedings Paper

Vertical scanning long trace profiler: a tool for metrology of x-ray mirrors
Author(s): Haizhang Li; Peter Z. Takacs; Tom Oversluizen
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This paper describes the development of a prototype instrument of the Vertical Scanning Long Trace Profiler (VSLTP) under a SBIR Phase II grant from NASA. The instrument is capable of scanning shell mirrors with a diameter as small as 100 mm for a travel distance of 700 mm in vertical configuration. Main components of the optical system are described. It has a beam separation set, a beam splitting set, a Fourier transform lens system, a penta prism pair, a Risley prism pair and a cylinder lens. The main hardware and software for implementation of the prototype instrument are also presented. They include the major mechanical structure, 9-axis motion control system and the data acquisition and analysis software. The design of the optical and mechanical systems makes the VSLTP very tolerable to the deformation of the slide deformation, laser pattern shift and fluctuation due to temperature change. Results obtained from the Phase I show that the VSLTP instrument is capable of a measurement accuracy of 50 nm for the height and 1 microradian for the slope.

Paper Details

Date Published: 1 November 1997
PDF: 8 pages
Proc. SPIE 3152, Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors, (1 November 1997); doi: 10.1117/12.295557
Show Author Affiliations
Haizhang Li, Continental Optical Corp. (United States)
Peter Z. Takacs, Brookhaven National Lab. (United States)
Tom Oversluizen, Creative Instrumentation (United States)


Published in SPIE Proceedings Vol. 3152:
Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors
Peter Z. Takacs; Thomas W. Tonnessen, Editor(s)

© SPIE. Terms of Use
Back to Top