Share Email Print
cover

Proceedings Paper

Structured slope errors on real x-ray mirrors: ray tracing versus experiment
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Ray-tracing plays an essential role for the design of a synchrotron radiation beamline optics. Nevertheless, it can also be extremely useful during the commissioning phase of a beamline. At that moment, it is possible to include real surface figure errors in the computer simulation of the optical devices. The resulting focal spot size and photon flux values are the final targets for the experimental optimization and alignment of the optics setup. We report on extensive ray-tracing of the mirror systems of the two beamlines placed at the ESRF insertion device 12. Slope errors measured after mirror delivery are included in the calculations. It is demonstrated how slope errors with characteristic periodicity between 1 and ca. 1/20 of the mirror length can affect the focal spot shape, size and position. In particular, they can create structures or satellites in the focal spot. The distortions from the ideal shape are generated by the polishing process itself and are intrinsic to each single mirror. Comparison between the effects of slope errors in ray-tracing using either real (measured) surfaces or numerically generated ones are also reported.

Paper Details

Date Published: 1 November 1997
PDF: 12 pages
Proc. SPIE 3152, Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors, (1 November 1997); doi: 10.1117/12.295553
Show Author Affiliations
Riccardo Signorato, European Synchrotron Radiation Facility (France)
Manuel Sanchez del Rio, European Synchrotron Radiation Facility (France)


Published in SPIE Proceedings Vol. 3152:
Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors
Peter Z. Takacs; Thomas W. Tonnessen, Editor(s)

© SPIE. Terms of Use
Back to Top