Share Email Print
cover

Proceedings Paper

Using advanced diagnostics to detect subsurface damage in sapphire
Author(s): David R. Black; Linda M. Braun; Harold Burdette; Christopher J. Evans; Bernard J. Hockey; Robert S. Polvani; Grady S. White
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The microstructure of sapphire modulus of rupture bars has been examined before and after a high-temperature anneal using a variety of characterization methods, collectively described as 'advanced diagnostics'. These methods include the localized techniques of transmission electron microscopy, Raman spectroscopy and high magnification polarized light microscopy, as well as the global techniques of x-ray diffraction topography, polariscope and wave font analysis. Comparison of data before and after annealing indicate that no change has occurred in the long-range strain distribution or subgrain structure. However, changes in microstructure consistent with the motion of dislocations within approximately 100 nm of the surface were observed.

Paper Details

Date Published: 1 November 1997
PDF: 12 pages
Proc. SPIE 3134, Optical Manufacturing and Testing II, (1 November 1997); doi: 10.1117/12.295133
Show Author Affiliations
David R. Black, National Institute of Standards and Technology (United States)
Linda M. Braun, National Institute of Standards and Technology (United States)
Harold Burdette, National Institute of Standards and Technology (United States)
Christopher J. Evans, National Institute of Standards and Technology (United States)
Bernard J. Hockey, National Institute of Standards and Technology (United States)
Robert S. Polvani, National Institute of Standards and Technology (United States)
Grady S. White, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3134:
Optical Manufacturing and Testing II
H. Philip Stahl, Editor(s)

© SPIE. Terms of Use
Back to Top