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Proceedings Paper

Spherical bent focusing analyzer for high-resolution inelastic x-ray scattering
Author(s): Markus Schwoerer-Boehning; Peter M. Abbamonte; Albert T. Macrander; Vladimir I. Kushnir
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Paper Abstract

A new technique for making a high resolution X-ray analyzer is presented. The analyzer consists of a silicon wafer with <111> orientation, a Pyrex glass wafer and a concave polished Pyrex glass substrate. The energy resolution of the analyzer was studied on the inelastic scattering beamline of the Synchrotron Radiation Instrumentation Collaborative Access Team on sector 3 of the APS using the Si(777) back reflection at 13.84 keV. Details are presented and compared with other techniques, and we discuss contributions of the measured energy resolution.

Paper Details

Date Published: 11 December 1997
PDF: 5 pages
Proc. SPIE 3151, High Heat Flux and Synchrotron Radiation Beamlines, (11 December 1997); doi: 10.1117/12.294487
Show Author Affiliations
Markus Schwoerer-Boehning, Argonne National Lab. (United States)
Peter M. Abbamonte, Argonne National Lab. (United States)
Albert T. Macrander, Argonne National Lab. (United States)
Vladimir I. Kushnir, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 3151:
High Heat Flux and Synchrotron Radiation Beamlines
Albert T. Macrander; Ali M. Khounsary, Editor(s)

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