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Proceedings Paper

Production and characterization of x-ray speckle at Sector 8 of the advanced photon source
Author(s): Alec R. Sandy; L. B. Lurio; S. G. J. Mochrie; A. Malik; G. Brian Stephenson; Mark Sutton
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Paper Abstract

We have implemented in the undulator first-optics enclosure of the Massachusetts Institute of Technology-McGill University-IBM Corporation Collaborative Access Team Sector at the Advanced Photon Source an x-ray beamline and a spectrometer optimized for performing small-angle, wide- bandpass, coherent x-ray scattering experiments. We describe the novel features of this set-up. The performance of the beamline and the spectrometer has been characterized by measuring static x-ray speckle patterns form isotopically disordered aerogels. Statistical analysis of the speckle patterns has been performed from which we extract the speckle width sand contrast versus wave-vector transfer and sample thickness. The measured speckle widths and contrast are compared to direct numerical evaluations of the intensity correlation function. The calculated widths are in poor agreement with the measurements but the calculated contrast agrees well with the measured contrast.

Paper Details

Date Published: 1 November 1997
PDF: 12 pages
Proc. SPIE 3154, Coherent Electron-Beam X-Ray Sources: Techniques and Applications, (1 November 1997); doi: 10.1117/12.293368
Show Author Affiliations
Alec R. Sandy, Massachusetts Institute of Technology (United States)
L. B. Lurio, Massachusetts Institute of Technology (United States)
S. G. J. Mochrie, Massachusetts Institute of Technology (United States)
A. Malik, Argonne National Lab. (United States)
G. Brian Stephenson, Argonne National Lab. (United States)
Mark Sutton, McGill Univ. (Canada)


Published in SPIE Proceedings Vol. 3154:
Coherent Electron-Beam X-Ray Sources: Techniques and Applications
Andreas K. Freund; Henry P. Freund; Malcolm R. Howells, Editor(s)

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