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Proceedings Paper

First measurements using the ALS soft x-ray Fourier transform spectrometer
Author(s): Edward J. Moler; Robert M. Duarte; Malcolm R. Howells; Zahid Hussain; Chul-Han Oh; John Spring
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Paper Abstract

Commissioning of a Fourier transform soft x-ray spectrometer is under way at the advanced light source, Lawrence Berkeley National Laboratory, as a branch of beamline 9.3.2. The spectrometer is a novel soft x-ray interferometer designed for ultra-high resolution spectroscopy in the photon energy region of 60-120 eV with a theoretical resolving power E/(Delta) E-106. This instrument is expected to provide experimental results which sensitively test models of correlated electron processes in atomic and molecular physics. The design criteria and consequent technical challenges posed by the short wavelengths of x-rays and desired resolving power are discussed. The fundamental and practical aspects of soft x-ray interferometry are also explored.

Paper Details

Date Published: 1 November 1997
PDF: 6 pages
Proc. SPIE 3154, Coherent Electron-Beam X-Ray Sources: Techniques and Applications, (1 November 1997); doi: 10.1117/12.293367
Show Author Affiliations
Edward J. Moler, Lawrence Berkeley National Lab. (United States)
Robert M. Duarte, Lawrence Berkeley National Lab. (United States)
Malcolm R. Howells, Lawrence Berkeley National Lab. (United States)
Zahid Hussain, Lawrence Berkeley National Lab. (United States)
Chul-Han Oh, Kyungpook National Univ. (South Korea)
John Spring, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 3154:
Coherent Electron-Beam X-Ray Sources: Techniques and Applications
Andreas K. Freund; Henry P. Freund; Malcolm R. Howells, Editor(s)

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