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Proceedings Paper

Aberration analysis calculations for synchrotron radiation beamline design
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Paper Abstract

The application of ray deviation calculations based on aberration coefficients for a single optical surface for the design of beamline optical systems is reviewed. A systematic development is presented which allows insight into which aberration may be causing the rays to deviate from perfect focus. A new development allowing analytical calculation of lineshape is presented.

Paper Details

Date Published: 3 November 1997
PDF: 8 pages
Proc. SPIE 3150, Gratings and Grating Monochromators for Synchrotron Radiation, (3 November 1997); doi: 10.1117/12.292731
Show Author Affiliations
Wayne R. McKinney, Lawrence Berkeley National Lab. (United States)
Malcolm R. Howells, Lawrence Berkeley National Lab. (United States)
Howard A. Padmore, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 3150:
Gratings and Grating Monochromators for Synchrotron Radiation
Wayne R. McKinney; Christopher A. Palmer, Editor(s)

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