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Proceedings Paper

X-ray multilayer gratings with very high diffraction efficiency
Author(s): Vladimir V. Martynov; Howard A. Padmore; A. Yuakshin; Yu A. Agafonov
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Paper Abstract

We report here the development of a hard x-ray multilayer grating that has achieved an absolute efficiency of 34% at a wavelength of 1.54A. The W-C multilayer itself has a reflectivity of 57% and the grating has a 0th order absolute efficiency of 36%. The origin of this extraordinarily high efficiency is that the short period and highly asymmetric structure of the grating combined with its deep grooves allows light to interact with a large number of layer pairs. This increases angular separation of the diffraction orders and reduces the multilayer bandwidth to the point where there is little or no order to order overlap in the grating structure, and hence maximum intensity can be diffracted into a selected order. This paper reports on the development of an optimized multilayer grating and some of its unique characteristics.

Paper Details

Date Published: 3 November 1997
PDF: 7 pages
Proc. SPIE 3150, Gratings and Grating Monochromators for Synchrotron Radiation, (3 November 1997); doi: 10.1117/12.292728
Show Author Affiliations
Vladimir V. Martynov, Institute of Microelectronics Technology (Russia) and Lawrence Berkeley National Lab. (United States)
Howard A. Padmore, Lawrence Berkeley National Lab. (United States)
A. Yuakshin, Institute of Microelectronics Technology (Russia)
Yu A. Agafonov, Institute of Microelectronics Technology (Russia)

Published in SPIE Proceedings Vol. 3150:
Gratings and Grating Monochromators for Synchrotron Radiation
Wayne R. McKinney; Christopher A. Palmer, Editor(s)

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