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Proceedings Paper

High-resolution large-area high-energy x-ray tomography
Author(s): James E. Trebes; Kenneth W. Dolan; Waleed S. Haddad; Jerry J. Haskins; Richard A. Lerche; Clinton M. Logan; Dwight E. Perkins; Daniel J. Schneberk; Derrill Rikard
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Paper Abstract

An x-ray tomography system is being developed for high resolution inspection of large objects. The goal is to achieve 25 micron resolution over object sizes that are tens of centimeters in extent. Typical objects will be metal in composition and therefore high energy, few MeV x-rays will be required. A proof-of-principle system with a limited field of view has been developed. Preliminary results are presented.

Paper Details

Date Published: 24 October 1997
PDF: 4 pages
Proc. SPIE 3149, Developments in X-Ray Tomography, (24 October 1997); doi: 10.1117/12.292723
Show Author Affiliations
James E. Trebes, Lawrence Livermore National Lab. (United States)
Kenneth W. Dolan, Lawrence Livermore National Lab. (United States)
Waleed S. Haddad, Lawrence Livermore National Lab. (United States)
Jerry J. Haskins, Lawrence Livermore National Lab. (United States)
Richard A. Lerche, Lawrence Livermore National Lab. (United States)
Clinton M. Logan, Lawrence Livermore National Lab. (United States)
Dwight E. Perkins, Lawrence Livermore National Lab. (United States)
Daniel J. Schneberk, Lawrence Livermore National Lab. (United States)
Derrill Rikard, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 3149:
Developments in X-Ray Tomography
Ulrich Bonse, Editor(s)

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