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Proceedings Paper

X-Ray tomography with micrometer spatial resolution
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Paper Abstract

3D computed tomographic images with micrometer resolution were made in phase-contrast mode with high energy x-rays at a third generation synchrotron source. The phase-contrast technique enables one to obtain information not only about the amplitude of the wave field behind the object and thus about the absorption, but also about the refractive index distribution inside the sample. Increasing the x-ray energy from the soft x-ray region up to 10-60 keV simplifies the experimental setup and opens the possibility to study organic samples at room-temperature and under normal pressure conditions. The projection data is recorded with a fast, high-resolution x-ray camera consisting of a 5 micrometers thin YAG scintillator crystal, a visible light microscope optics and a slow scan 1k X 1k CCD camera. The spatial resolution of phase-contrast microtomography is currently limited by the resolution of the x-ray detector to about 1-2 micrometers . First applications in biology and geophysics are shown.

Paper Details

Date Published: 24 October 1997
PDF: 9 pages
Proc. SPIE 3149, Developments in X-Ray Tomography, (24 October 1997); doi: 10.1117/12.292719
Show Author Affiliations
Carsten Raven, European Synchrotron Radiation Facility (France)
Anatoly A. Snigirev, European Synchrotron Radiation Facility (France)
Andreas Koch, European Synchrotron Radiation Facility (France)
Irina Snigireva, European Synchrotron Radiation Facility (France)
Victor Kohn, European Synchrotron Radiation Facility (France)


Published in SPIE Proceedings Vol. 3149:
Developments in X-Ray Tomography
Ulrich Bonse, Editor(s)

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