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Proceedings Paper

Real-time robust line detection in microscopy images
Author(s): Ashit Talukder; David P. Casasent
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Paper Abstract

We discuss an algorithm to detect lines in low contrast images in the presence of noise. The image we consider are orientation imaging microscopy (OIM) images of metal surfaces. The objective is to locate lines (boundaries between grains) in the OIM images and use that information to determine where three grains intersect (triple junctions). We use a novel method for fusion edge enhancement and a new fast skeletonization procedure using a new and efficient hit and miss transform (HMT) that produces lines of one pixel width.

Paper Details

Date Published: 26 September 1997
PDF: 9 pages
Proc. SPIE 3208, Intelligent Robots and Computer Vision XVI: Algorithms, Techniques, Active Vision, and Materials Handling, (26 September 1997); doi: 10.1117/12.290321
Show Author Affiliations
Ashit Talukder, Carnegie Mellon Univ. (United States)
David P. Casasent, Carnegie Mellon Univ. (United States)


Published in SPIE Proceedings Vol. 3208:
Intelligent Robots and Computer Vision XVI: Algorithms, Techniques, Active Vision, and Materials Handling
David P. Casasent, Editor(s)

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