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Proceedings Paper

Real-time digital/optical system for quality control by moire image processing
Author(s): Michel M. Bruynooghe; Alain Bergeron; Eric Colon
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Paper Abstract

In this contribution, we propose an optoelectronic correlator system for real-time quality control by Moire analysis, that integrates a VanderLugt optical correlator and a fast digital signal processor associated to a vector co-processor. The phase-shifting Moire technique and optical correlation have been used for automatic 3D inspection of manufactured objects that are approximately positioned. Our algorithmic procedure for supervised real-time quality control by Moire analysis is a two stage process. First we preprocess phase Moire images by smoothing and subsampling to enhance the robustness of defect detection. Then, the detection of defects is performed directly from the phase pattern data by optical correlation, correspondence analysis and statistical supervised classification. Experimental results have shown that supervised detection of defects can be performed accurately in real-time.

Paper Details

Date Published: 26 September 1997
PDF: 10 pages
Proc. SPIE 3208, Intelligent Robots and Computer Vision XVI: Algorithms, Techniques, Active Vision, and Materials Handling, (26 September 1997); doi: 10.1117/12.290316
Show Author Affiliations
Michel M. Bruynooghe, Univ. Louis Pasteur/Strasbourg (France)
Alain Bergeron, National Optics Institute (Canada)
Eric Colon, HOLO3 Co. (France)


Published in SPIE Proceedings Vol. 3208:
Intelligent Robots and Computer Vision XVI: Algorithms, Techniques, Active Vision, and Materials Handling
David P. Casasent, Editor(s)

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