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Proceedings Paper

Infrared microspectroscopy with synchrotron radiation
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Paper Abstract

Infrared microspectroscopy with a high brightness synchrotron source can achieve a spatial resolution approaching the diffraction limit. However, in order to realize this intrinsic source brightness at the specimen location, some care must be taken in designing the optical system. Also, when operating in diffraction limited conditions, the effective spatial resolution is no longer controlled by the apertures typically used for a conventional (geometrically defined) measurement. Instead, the spatial resolution depends on the wavelength of light and the effective apertures of the microscope's Schwarzchild objectives. We have modeled the optical system from the synchrotron source up to the sample location and determined the diffraction-limited spatial distribution of light. Effects due to the dependence of the synchrotron source's numerical aperture on wavelength, as well as the difference between transmission and reflection measurement modes, are also addressed. Lastly, we examine the benefits (when using a high brightness source) of an extrinsic germanium photoconductive detector with cone optics as a replacement for the standard MCT detector.

Paper Details

Date Published: 16 October 1997
PDF: 8 pages
Proc. SPIE 3153, Accelerator-Based Infrared Sources and Applications, (16 October 1997); doi: 10.1117/12.290262
Show Author Affiliations
G. Lawrence Carr, Brookhaven National Lab. (United States)
Gwyn P. Williams, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 3153:
Accelerator-Based Infrared Sources and Applications
Gwyn P. Williams; Paul Dumas, Editor(s)

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