Share Email Print

Proceedings Paper

Industrial applications of accelerator-based infrared sources: analysis using infrared microspectroscopy
Author(s): Jean Louis Bantignies; Gilbert Fuchs; G. Lawrence Carr; Paul Dumas; Catherine Wilhelm
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Infrared Microspectroscopy, using a globar source, is now widely employed in the industrial environment, for the analysis of various materials. Since synchrotron radiation is a much brighter source, an enhancement of an order of magnitude in lateral resolution can be achieved. Thus, the combination of IR microspectroscopy, and synchrotron radiation provides a powerful tool enabling sample regions only few microns size to be studied. This opens up the potential for analyzing small particles. Some examples for hair, bitumen and polymer are presented.

Paper Details

Date Published: 16 October 1997
PDF: 8 pages
Proc. SPIE 3153, Accelerator-Based Infrared Sources and Applications, (16 October 1997); doi: 10.1117/12.290257
Show Author Affiliations
Jean Louis Bantignies, Elf Atochem (France)
Gilbert Fuchs, Elf Atochem (France)
G. Lawrence Carr, Brookhaven National Lab. (United States)
Paul Dumas, Lab. pour l'Utilisation du Rayonnement Electromagnetique/Univ. de Paris-Sud (France)
Catherine Wilhelm, Elf Atochem (France)

Published in SPIE Proceedings Vol. 3153:
Accelerator-Based Infrared Sources and Applications
Gwyn P. Williams; Paul Dumas, Editor(s)

© SPIE. Terms of Use
Back to Top