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Proceedings Paper

Comparison of three different ray trace programs for x-ray and infrared synchrotron beamline designs
Author(s): Steven C. Irick; Christian Jung
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Paper Abstract

There are a number of ray trace programs currently used for the design of synchrotron beamlines. While several of these programs have been written and used mostly within the programmer's institution, many have also been available to the general public. This paper discusses three such programs. One is a commercial product oriented for the general optical designer (not specifically for synchrotron beamlines). One is designed for synchrotron beamlines and is free with restricted availability. Finally, one is designed for synchrotron beamlines and is used primarily in one institution. The wealth of information from general optical materials and components catalogs is readily available in the commercial program for general optical designs. This makes the design of an infrared beamline easier from the standpoint of component selection. However, this program is not easily configured for synchrotron beamline designs, particularly for a bending magnet source. The synchrotron ray trace programs offer a variety of sources, but generally are not as easy to use from the standpoint of the user interface. This paper shows ray traces of the same beamline using Optikwerks, SHADOW, and RAY, and compares the results.

Paper Details

Date Published: 16 October 1997
PDF: 10 pages
Proc. SPIE 3153, Accelerator-Based Infrared Sources and Applications, (16 October 1997); doi: 10.1117/12.290253
Show Author Affiliations
Steven C. Irick, Lawrence Berkeley National Lab. (United States)
Christian Jung, Berliner Elektronenspeicherring-Gesellschaft fur Synchrontronstrahlung mbH (Germany)


Published in SPIE Proceedings Vol. 3153:
Accelerator-Based Infrared Sources and Applications
Gwyn P. Williams; Paul Dumas, Editor(s)

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