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Proceedings Paper

Modern numerical techniques and software for photo- and thermoemission electron optical systems computer-aided design
Author(s): Mikhail A. Monastyrski; Sergei V. Andreev; Inna S. Gaidukova; Victor A. Tarasov; Anatoly M. Filachev
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Paper Abstract

The paper is devoted to software development for simulation, optimization, and computer-aided design of photo/thermo- emission electron optical systems and units. The first part of the paper presents the applied program package (APP) 'ELIM\DYNAMICS\ intended for computer-aided design of dynamic photo-emission image tubes with electro/magnetostatic focusing and deflection (streak tubes). The developed software allows highly precise computation of basic image quality characteristics both in static and streak modes. One of the main advantages of the new program version presented is that 'through' electron beam computation from the photocathode to image receiver is available with regard to dynamic aberrations caused by scattering fields located nearby the edges of deflecting plates. In the second part, the possibility is shown to generalize some numerical techniques being effectively applied in photo-emission imaging electron optics (namely, the (tau) -variation -- and the first kind integral equations techniques) to simulation of the thermo-emission electron beam technology units. Functions of the new APP 'CHARGE' are presented, and some numerical aspects of the self-coordinated problem are discussed.

Paper Details

Date Published: 25 September 1997
PDF: 7 pages
Proc. SPIE 3155, Charged Particle Optics III, (25 September 1997); doi: 10.1117/12.287816
Show Author Affiliations
Mikhail A. Monastyrski, General Physics Institute (Russia)
Sergei V. Andreev, General Physics Institute (Russia)
Inna S. Gaidukova, Research Institute for Electron and Ion Optics (Russia)
Victor A. Tarasov, General Physics Institute (Russia)
Anatoly M. Filachev, Research Institute for Electron and Ion Optics (Russia)


Published in SPIE Proceedings Vol. 3155:
Charged Particle Optics III
Eric Munro, Editor(s)

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