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Proceedings Paper

Speckle correlations in the light scattered and transmitted by dielectric and metal films with rough surfaces
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Paper Abstract

Diagrammatic perturbation theory is used to compute the angular intensity correlation function C(q,kq',k') equals <[I(qk) - <I(qk)>][I(q'k') - <I (q'k')]> for light scattered from a dielectric film on a perfectly conducting substrate and light scattered from and transmitted through a thin metallic film. The illuminated surface in each of these systems is taken to be a weakly rough, one-dimensional random surface, I(qk) is the squared modulus of the scattering matrix for the system, and q, q' and k,k' are the projections on the mean scattering surface of the wave vectors of the scattered and incident light, respectively. Contributions to C include: (1) a short range memory effect and time-reversed memory effect terms associated with the resonant excitation of guided or surface waves in the films, C(1); (2) an additional short range term of comparable magnitude C(10); (3) a long range term C(2); (4) an infinite range term C(3); (5) and a terms C(1.5) that along with C(2) displays peaks associated with the excitation of guided or surface waves.

Paper Details

Date Published: 26 September 1997
PDF: 14 pages
Proc. SPIE 3141, Scattering and Surface Roughness, (26 September 1997); doi: 10.1117/12.287798
Show Author Affiliations
Arthur R. McGurn, Western Michigan Univ. (United States)
Alexei A. Maradudin, Univ. of California/Irvine (United States)


Published in SPIE Proceedings Vol. 3141:
Scattering and Surface Roughness
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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