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Proceedings Paper

Final design, assembly, and testing of a space-based total integrated scatter instrument
Author(s): James B. Hadaway; Anees Ahmad; Jean M. Bennett
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Paper Abstract

The final design, fabrication, and testing of a space-based scatterometer has been completed and is described in this paper. The instrument, part of the optical properties monitor (OPM) experiment developed for NASA by AZ Technology in Huntsville, was designed to fly for an extended period in low earth orbit to monitor the effects of the orbital environment on various materials and coatings. The scatterometer measures the total integrated scatter (TIS) of various samples at wavelengths of 532 and 1064 nm. The instrument is able to distinguish between surface roughening and surface contamination and operates with an accuracy of plus or minus 10% and a repeatability of plus or minus 2%. The instrument is now attached to the outer hull of the MIR space station and is scheduled to operate for nine months or more before being returned to Earth.

Paper Details

Date Published: 26 September 1997
PDF: 11 pages
Proc. SPIE 3141, Scattering and Surface Roughness, (26 September 1997); doi: 10.1117/12.287796
Show Author Affiliations
James B. Hadaway, Ctr. for Applied Optics/Univ. of Alabama in Huntsville (United States)
Anees Ahmad, Ctr. for Applied Optics/Univ. of Alabama in Huntsville (United States)
Jean M. Bennett, Naval Air Warfare Ctr. (United States)


Published in SPIE Proceedings Vol. 3141:
Scattering and Surface Roughness
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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