Share Email Print

Proceedings Paper

Design review of an in-situ bidirectional reflectometer
Author(s): Michael T. Beecroft; Phillip R. Mattison
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Recently, Surface Optics Corporation has designed and manufactured a field portable bidirectional reflectometer that measures the bidirectional reflectance of samples in place without the need to take samples into the laboratory. The instrument consists of a measurement head, power supply box, and a PC. The measurement head weighs approximately sixty pounds and it contains the source, detector, stepper motors for varying the incident and reflected angles, and a filter wheel. All of these components are software controlled for measuring the BRDF of samples from 400 nm to 1100 nm (VIS-NIR configuration) or 3.0 micrometer to 12.0 micrometer (IR configuration) at incident polar angles of 0 to 60 degrees. The detector can map the BRDF of a sample from 0 to 85 degrees polar angle and 0 to 180 degrees in azimuth. The instrument configuration is reviewed and measured data presented on a blue krylon paint sample.

Paper Details

Date Published: 26 September 1997
PDF: 13 pages
Proc. SPIE 3141, Scattering and Surface Roughness, (26 September 1997); doi: 10.1117/12.287795
Show Author Affiliations
Michael T. Beecroft, Surface Optics Corp. (United States)
Phillip R. Mattison, Surface Optics Corp. (United States)

Published in SPIE Proceedings Vol. 3141:
Scattering and Surface Roughness
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

© SPIE. Terms of Use
Back to Top