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Proceedings Paper

Challenges of adapting a dual-wavelength infrared imaging system as an industrial inspection tool
Author(s): Behrouz N. Shabestari; Helen E. Kourous; Spencer D. Luster; Jaroslaw P. Sacha; Stephen Graff
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Paper Abstract

Non-contact thermal measurement techniques such as on-line thermography can be valuable tools for process monitoring and quality control. Many manufacturing processes such as welding or casting are thermally driven, or exhibit strong correlation between thermal conditions and product characteristics. Infrared inspection of self-emitted radiation can provide valuable insight into process parameters not routinely observed yet which dominate product quality. Recent advances in IR system technology coupled with significant reductions in cost are making thermography a viable tool for such on-line monitoring. This paper describes the implementation of a novel rugged thermal imaging system based on a dual-wavelength technique for a large intelligent process monitoring project. The object of the portion described herein is to deploy a non- contact means of monitoring tooling surface thermal conditions. The technical and practical challenges of developing such a non-contact thermal measurement system for continuous inspection in an industrial environment are discussed, and methods of resolving them are presented. These challenges include implementation of a wavelength filter system for quantitative determination of the surface temperature. Also, unlike visible-spectrum machine vision applications, surface emissivity of the test object as well as reflections from other IR emitters must be taken into account when measuring infrared radiation for a part or process. However, the primary issues that must be addressed prior to deployment are compensation for ambient temperature conditions and optimization of the calibration process. Other issues center on remote camera control, image acquisition, data synchronization, and data interpretation. An example application of this system, along with preliminary data, is described.

Paper Details

Date Published: 18 September 1997
PDF: 8 pages
Proc. SPIE 3205, Machine Vision Applications, Architectures, and Systems Integration VI, (18 September 1997); doi: 10.1117/12.285588
Show Author Affiliations
Behrouz N. Shabestari, Edison Industrial Systems Ctr. (United States)
Helen E. Kourous, Edison Industrial Systems Ctr. (United States)
Spencer D. Luster, Edison Industrial Systems Ctr. (United States)
Jaroslaw P. Sacha, Edison Industrial Systems Ctr. (United States)
Stephen Graff, Technology Resources, Inc. (United States)


Published in SPIE Proceedings Vol. 3205:
Machine Vision Applications, Architectures, and Systems Integration VI
Susan Snell Solomon; Bruce G. Batchelor; John W. V. Miller, Editor(s)

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