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Proceedings Paper

Failure rate estimation in the case of zero failures
Author(s): David J. Meade
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Paper Abstract

When a reliability test ends in zero units having failed, traditional reliability calculations suggest that the estimated failure rate is also zero, assuming an exponential distribution. However, this is not a realistic estimate of the failure rate, as it does not take into account the number of units on test. In such cases, a reasonable approach is to select a failure rate that makes the likelihood of observing zero failures equal to 50%. In other words, we select a failure rate that carries with it a high probability of observing zero failures for a given reliability test'. In this paper we review this methodology and demonstrate how it has been implemented at Advanced Micro Devices (AMD) through a user friendly EXCEL based software application. Customized software tools such as this have led to increased awareness, productivity, and accuracy in reliability calculations at AMD.

Paper Details

Date Published: 11 September 1997
PDF: 7 pages
Proc. SPIE 3216, Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III, (11 September 1997); doi: 10.1117/12.284700
Show Author Affiliations
David J. Meade, Advanced Micro Devices, Inc. (United States)


Published in SPIE Proceedings Vol. 3216:
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III
Ali Keshavarzi; Sharad Prasad; Hans-Dieter Hartmann, Editor(s)

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