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Proceedings Paper

Effect of cycle time and fab yield variation on the number of wafer outs variability: a Monte Carlo case study
Author(s): Carlos Ortega; Javier Bonal; Javier Conde Collado
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Paper Abstract

The expected number of wafers outs generated by fiscal weeks is used commonly to define the company budget. The traditional approach to determine this quantity has been so far, the use of static analytical tools like the spreadsheets in which the cycle time and fab yield variation is ignored. Both variables are treated as fixed inputs, disregarding consequently their non-deterministic nature. This special behaviour could cause an unexpected result in the throughput forecasted with important financial consequences. This paper proposes an alternative approach, based on the Monte Carlo method, to the static calculation and studies the expected variability in the number of outs when the cycle time and the fab yield are considered as variables randomly distributed. The expected variability and its dependence to the method elected -static and fixed vs. dynamic and variable- are studied.

Paper Details

Date Published: 11 September 1997
PDF: 6 pages
Proc. SPIE 3216, Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III, (11 September 1997); doi: 10.1117/12.284689
Show Author Affiliations
Carlos Ortega, Lucent Technologies Microelectronica de Espana (Spain)
Javier Bonal, Lucent Technologies Microelectronica de Espana (Spain)
Javier Conde Collado, Univ. de Castilla La Mancha (Spain)


Published in SPIE Proceedings Vol. 3216:
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III
Ali Keshavarzi; Sharad Prasad; Hans-Dieter Hartmann, Editor(s)

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