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Proceedings Paper

Improved meshing technique and its application in the analysis of large and complex MEMS systems
Author(s): Yie He; James Marchetti; Fariborz Maseeh
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Paper Abstract

This paper presents a new local refining meshing algorithm which is referred to as the exposed face mesh (EFM) algorithm, for 3D coupled electromechanical analysis with multiple dielectrics. This algorithm allows for the independent refinement of the electrostatic mesh and mechanical mesh in a coupled system. This approach is compared to the commonly used volume refining mesh method in which both the electrostatic and mechanical mesh domains are refined concurrently. The new EFM method is shown to have substantial improvement in increasing accuracy of results and reducing computational expense especially for fringe electric field dominated structures. For a typical comb drive structure, the EFM algorithm generates much fewer volume mesh nodes for mechanical analysis and fewer surface mesh panels for electrostatic analysis than the standard volume refining mesh method. At the same time, the EFM method showed an improvement in accuracy from 15 percent to within 5 percent for this case. The IntelliCAD MEMS modeling software has incorporated this EFM algorithm and made it a unique software system to handle general device structures accurately.

Paper Details

Date Published: 5 September 1997
PDF: 7 pages
Proc. SPIE 3224, Micromachined Devices and Components III, (5 September 1997); doi: 10.1117/12.284521
Show Author Affiliations
Yie He, IntelliSense Corp. (United States)
James Marchetti, IntelliSense Corp. (United States)
Fariborz Maseeh, IntelliSense Corp. (United States)


Published in SPIE Proceedings Vol. 3224:
Micromachined Devices and Components III
Kevin H. Chau; Patrick J. French, Editor(s)

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