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Proceedings Paper

Determination of the Pockels tensor component ratio by Mach-Zehnder interferometry in a poled polymer thin film
Author(s): Jeong Weon Wu; H. R. Cho; M. J. Shin; Song-Hee Han
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Paper Abstract

A Mach-Zehnder interferometry is employed to measure the Pockels coefficients in a poled polymer thin film in both the coplanar and the parallel-plate electrode structures. The modulated intensity ofthe Mach-Zehnder interferometer is investigated as a function of the optical bias in the reference arm, the modulation voltage applied to the film, the polarization angle of the incident light, and the angle of incidence on the film, as a complete analysis of the optical characterization of an electro-optic polymer film. The Mach-Zehnder interferometry measurement of the Pockels coefficients has an advantage over the single-beam polarization interferometry in permitting the independent determination of the Pockels tensor components, r13 and r33.

Paper Details

Date Published: 13 October 1997
PDF: 8 pages
Proc. SPIE 3147, Nonlinear Optical Properties of Organic Materials X, (13 October 1997); doi: 10.1117/12.284242
Show Author Affiliations
Jeong Weon Wu, Ewha Womans Univ. (South Korea)
H. R. Cho, Ewha Womans Univ. (South Korea)
M. J. Shin, Ewha Womans Univ. (South Korea)
Song-Hee Han, Ewha Womans Univ. (South Korea)

Published in SPIE Proceedings Vol. 3147:
Nonlinear Optical Properties of Organic Materials X
Mark G. Kuzyk, Editor(s)

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