Share Email Print

Proceedings Paper

Dispersion of GRADIUM glasses from 350 to 2500 nm
Author(s): Boyd V. Hunter; James M. Palmer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Precise optical design requires detailed knowledge of the refractive index. GRADIUM® glasses further complicate these calculations because the refractive index is a function of axial position within the lens blank. LightPath has used a 16-coefficient Buchdahl dispersion model to allow the computation of the appropriate profile as a function of wavelength. The initial coefficients published for the GSF glass family relied on published data for base glasses and were restricted to the visible regime.1 There are many opportunities for use of GRADIUM materials in the NIR. Because there was no experimental data available to confirm the dispersion of these materials in this regime, experiments were conducted to measure the refractive index profiles of various GRADIUM glasses in the visible through the NIR. With the availability of this information, GRADIUM glasses can be applied to NIR imaging, communications, or other applications requiring information about the refractive index profile at these wavelengths. From these experiments of refractive index versus axial position as a function of wavelength, a revised dispersion model is presented for the GSF glass family. In addition, a new crown GRADIUM glass, which is under development, were also tested.

Paper Details

Date Published: 25 September 1997
PDF: 10 pages
Proc. SPIE 3130, Lens Design, Illumination, and Optomechanical Modeling, (25 September 1997); doi: 10.1117/12.284074
Show Author Affiliations
Boyd V. Hunter, LightPath Technologies, Inc. (United States)
James M. Palmer, Optical Sciences Ctr./Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 3130:
Lens Design, Illumination, and Optomechanical Modeling
R. Barry Johnson; Robert E. Fischer; R. Barry Johnson; Richard C. Juergens; Richard C. Juergens; Paul R. Yoder; Warren J. Smith; Paul R. Yoder, Editor(s)

© SPIE. Terms of Use
Back to Top