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Proceedings Paper

Characterization of a femtosecond-laser-produced plasma x-ray source by electronic, optical, and x-ray diagnostic techniques
Author(s): Jean-Claude J. Gauthier; S. Bastiani; Patrick Audebert; Jean-Paul Geindre; Antoine Rousse; C. Quoix; G. Grillon; Andre Mysyrowicz; Andre Antonetti; Roberto C. Mancini; Alla S. Shlyaptseva
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Paper Abstract

Short-pulse laser-produced plasmas look very promising for the generation of sub-picosecond X-rays. By combining several experimental techniques, we have significantly progressed towards a better understanding of ultrafast laser-matter interaction. The X-ray yield is a sensitive function of the electron density gradient scale length of the target plasma. In this work, the scale length has been changed by varying the temporal separation between the main laser pulse and a lower intensity prepulse. X-ray spectroscopic diagnostics of the plasma parameters have been used from the analysis of resonance and dielectronic satellite lines. The angular and energy distribution of suprathermal electrons emitted during the ultrafast laser- plasma interaction have been measured as a function of laser polarization and prepulse delay. Frequency-domain interferometry and optical measurements of the reflected probe pulse have been used to study the velocity and the gradient scale length of the expanding plasma. The Kα emission yield peaks for a scale length where resonant absorption is optimized. Hydrodynamic simulations have been performed to investigate the plasma dynamics and the basic processes which control the X-ray emission duration and intensity. Applications of ultrashort Kα X-rays to the diagnostic of solid plasma conditions and as a source for time-resolved diffraction and spectroscopy of transient chemical, biological or physical phenomena are underway.

Paper Details

Date Published: 14 October 1997
PDF: 12 pages
Proc. SPIE 3157, Applications of X Rays Generated from Lasers and Other Bright Sources, (14 October 1997); doi: 10.1117/12.284003
Show Author Affiliations
Jean-Claude J. Gauthier, Ecole Polytechnique (France)
S. Bastiani, Ecole Polytechnique (France)
Patrick Audebert, Ecole Polytechnique (France)
Jean-Paul Geindre, Ecole Polytechnique (France)
Antoine Rousse, Ecole Nationale des Sciences et Techniques Avancees (France)
C. Quoix, Ecole Nationale des Sciences et Techniques Avancees (France)
G. Grillon, Ecole Nationale des Sciences et Techniques Avancees (France)
Andre Mysyrowicz, Ecole Nationale des Sciences et Techniques Avancees (France)
Andre Antonetti, Ecole Nationale des Sciences et Techniques Avancees (France)
Roberto C. Mancini, Univ. of Nevada (United States)
Alla S. Shlyaptseva, Univ. of Nevada (United States)


Published in SPIE Proceedings Vol. 3157:
Applications of X Rays Generated from Lasers and Other Bright Sources
George A. Kyrala; Jean-Claude J. Gauthier, Editor(s)

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