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Proceedings Paper

Use of spherically bent crystals for Nike laser plasma spectral diagnostics and monochromatic imaging
Author(s): Yefim Aglitskiy; Thomas Lehecka; Stephen P. Obenschain; Stephen E. Bodner; Carl J. Pawley; K. Gerber; J. D. Sethian; Charles M. Brown; John F. Seely; Uri Feldman; Glenn E. Holland
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Paper Abstract

A new x-ray imaging system based on spherically curved crystals has been developed. It is designed and used for diagnostics of targets ablatively accelerated by the Nike KrF laser. Applications of this instrument include spectroscopy with one-dimension of spatial resolution and two-dimensional monochromatic self-imaging and backlighting. The imaging system with various crystals of mica and quartz is used for plasma diagnostics of the main target and for characterization of potential backlighters. A spherically curved quartz crystal (2d equals 6.687 angstroms, R equals 200 mm) is used to produce monochromatic backlit images with the He- like Si resonance line (1865 eV) as the source of radiation. The spatial resolution of the x-ray optical system is 1.7 micrometers in selected places and 2 - 3 micrometers over large area. Time resolved backlit monochromatic images of CH planar targets driven by the Nike facility have been obtained with 6 - 7 micrometers spatial resolution.

Paper Details

Date Published: 14 October 1997
PDF: 12 pages
Proc. SPIE 3157, Applications of X Rays Generated from Lasers and Other Bright Sources, (14 October 1997); doi: 10.1117/12.284001
Show Author Affiliations
Yefim Aglitskiy, Science Applications International Corp. (United States)
Thomas Lehecka, Science Applications International Corp. (United States)
Stephen P. Obenschain, Naval Research Lab. (United States)
Stephen E. Bodner, Naval Research Lab. (United States)
Carl J. Pawley, Naval Research Lab. (United States)
K. Gerber, Naval Research Lab. (United States)
J. D. Sethian, Naval Research Lab. (United States)
Charles M. Brown, Naval Research Lab. (United States)
John F. Seely, Naval Research Lab. (United States)
Uri Feldman, Naval Research Lab. (United States)
Glenn E. Holland, SFA Inc. (United States)

Published in SPIE Proceedings Vol. 3157:
Applications of X Rays Generated from Lasers and Other Bright Sources
George A. Kyrala; Jean-Claude J. Gauthier, Editor(s)

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